Testing and characterizing of Analog to Digital Converter (ADC) is still a challenging concern for real time mixed signal analysis, manufacturers and designers for consideration of factor like cost and time. The goal of such process is to validate in a short time whether a given ADC unite its performance requirements. ADC is an important device generally used in today's advanced communication and electronics applications like: microwave system, military applications, satellite communication and medical application for interfacing analog electronics with digital electronics. The ADC testing is mainly resolute by three technologies: linear stimulus generation, fast data capture and precision clock timing. The bottle neck analyzed in testing of recently high-performance ADCs is the linear signal generation, as the present need of technologies on timing and data capture can handle the testing need of upcoming ADCs. For current high-resolution ADCs, time for full-code INL and DNL test, which is directly related with the cost, is comparative long because of the large number of variables to be accurately measured.
Testing and characterizing of Analog to Digital Converter (ADC) is still a challenging concern for real time mixed signal analysis, manufacturers and designers for consideration of factor like cost and time. The goal of such process is to validate in a short time whether a given ADC unite its performance requirements. ADC is an important device generally used in today's advanced communication and electronics applications like: microwave system, military applications, satellite communication and medical application for interfacing analog electronics with digital electronics. The ADC testing is mainly resolute by three technologies: linear stimulus generation, fast data capture and precision clock timing. The bottle neck analyzed in testing of recently high-performance ADCs is the linear signal generation, as the present need of technologies on timing and data capture can handle the testing need of upcoming ADCs. For current high-resolution ADCs, time for full-code INL and DNL test, which is directly related with the cost, is comparative long because of the large number of variables to be accurately measured.